Noncontact wafer identification.

نویسندگان
چکیده

برای دانلود رایگان متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Noncontact semiconductor wafer characterization with the terahertz Hall effect

We demonstrate noncontact measurements of the Hall mobility of doped semiconductor wafers with roughly 250 mm spatial resolution, using polarization rotation of focused beams of terahertz ~THz! radiation in the presence of a static magnetic field. Quantitative and independent images of both carrier density and mobility of a doped semiconductor wafer have been obtained. © 1997 American Institute...

متن کامل

Multivariable feedback relevant system identification of a wafer stepper system

This paper discusses the approximate and feedback relevant parametric identi cation of a positioning mechanism present in a wafer stepper. The positioning mechanism in a wafer stepper is used in chip manufacturing processes for accurate positioning of the silicon wafer on which the chips are to be produced. The accurate positioning requires a robust and high performance feedback controller that...

متن کامل

Wafer-to-Wafer Bonding for Microstructure Formation

Wafer-to-wafer bonding processes for microstructure fabrication are categorized and described. These processes have an impact in packaging and structure design. Processes are categorized into direct bonds, anodic bonds, and bonds with intermediate layers. Representative devices using wafer-to-wafer bonding are presented. Processes and methods for characterization of a range of bonding methods a...

متن کامل

Noncontact friction between nanostructures

We calculate the van der Waals friction between two semi-infinite solids in normal relative motion and find a drastic difference in comparison with the parallel relative motion. The case of good conductors is investigated in detail both within the local optic approximation and using a nonlocal optic dielectric approach. We show that the friction may increase by many orders of magnitude when the...

متن کامل

Noncontact atomic force microscopy

No other method has opened the door to progress in nanoscience and nanotechnology as much as the introduction of scanning probe methods did in the 1980s, since they offer a way to visualize the nanoworld. For maximum impact, however, the ability to image and manipulate individual atoms is the key. Initially, scanning tunneling microscopy was the only scanningprobe-based method that was able to ...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

ژورنال

عنوان ژورنال: Journal of the Japan Society for Precision Engineering

سال: 1986

ISSN: 1882-675X,0912-0289

DOI: 10.2493/jjspe.52.1024